Deep Classifiers with Label Noise Modeling and Distance Awareness

Vincent Fortuin, Mark Collier, Florian Wenzel, James Allingham, Jeremiah Liu, Dustin Tran, Balaji Lakshminarayanan, Jesse Berent, Rodolphe Jenatton, Effrosyni Kokiopoulou
January, 2022
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Journal article
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TMLR
Vincent Fortuin
Vincent Fortuin
Research group leader in Machine Learning

My research interests include Bayesian deep learning, generative AI, and meta-learning.